Step Into The Future Of Metrology
We build measurement systems for evaluating even the most challenging surfaces with performance unlike any other.
Measures large
objects up to 2.5
x 2.5 m
Measurement accuracy
<10um, even at the
largest size
Measurement results in
less than 5 minutes
100s of times greater sampling than CMMs or laser trackers
No surface contact
required
And we’re doing more every day…
We’re advancing our methods toward nanometer level accuracy on reflective surfaces such as semiconductor wafers, optical mirrors, and lenses, through our National Science Foundation SBIR Grant.
If this sounds exciting to you, contact us to request our newsletter for regular updates on our progress!
Application
Steel molds
Application
Damage Analysis
Application